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A metallic substance that is composed of two or more elements. |
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The vibration of an atom about its normal position in a substance. |
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A concentration specification on the basis of the number of moles (or atoms) of a particular element relative to the total number of moles (or atoms) of all elements within an alloy. |
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A thermal energy constant having the value of 1.38x10^-23 J/atom*K; gas constant. |
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A vector that denotes the magnitude and direction of lattice distortion associated with a dislocation. |
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The relative content of a particular element or constituent (i) within an alloy, usually expressed in weight percent or atom percent. |
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The line that extends along the end of the extra half-plane of atoms for an edge of dislocation, and along the center of the spiral of a screw dislocation. |
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A linear crystalline defect associated with the lattice distortion produced in the vicinity of the end of an extra half-plane of atoms within a crystal. The Burgers vector is perpendicular to the dislocation line. |
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The average grain diameter as determine from a random cross section. |
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A deviation from perfection; normally applied to crystalline materials wherein there is a deviation from atomic/molecular order and/or continuity. |
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interstitial solid solution |
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A solid solution wherein relatively small solute atoms occupy interstitial positions between the solvent or host atoms. |
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The investigation of microstructural elements using some kind of microscope. |
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The structural features of an alloy (e.g. grain and phase structure) that are subject to observation under a microscope. |
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A dislocation that has both edge and screw components. |
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A photograph made with a microscope that records a microstructural image. |
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A crystalline defect associated with one or, at most, several atomic sites. |
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scanning electron microscope (SEM) |
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Definition
A microscope that produces an image by using an electron beam that scans the surface of a specimen; an image is produced by reflected electron beams. Examination of surface and/or microstructural features at high magnification is possible. |
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scanning probe microscope (SPM) |
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Definition
A microscope that does not produce an image using light radiation. Rather, a very small and sharp probe raster scans across the specimen surface; out-of-surface plane deflections in response to electronic or other interactions with the probe are monitored, form which a topographical map of the specimen surface (on a nanometer scale) is produced. |
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A linear crystalline defect associated with the lattice distortion created when normally parallel planes are joined together to form a helical ramp. The Burgers vector is parallel to the dislocation line. |
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A host atom or ion that is positioned on an interstitial lattice site. |
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A homogeneous crystalline phase that contains two or more chemical species. Both substitutional and interstitial solid solutions are possible. |
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One component or element of a solution present in a minor concentration. It is dissolved in the solvent. |
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The component of a solution present in the greatest amount. It is the component that dissolves a solute. |
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substitutional solid solution |
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A solid solution wherein the solute atoms replace or substitute for the host atoms. |
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transmission electron microscope (TEM) |
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A microscope that produces an image by using electron beams that are transmitted (pass through) the specimen. Examination of internal features at high magnifications is possible. |
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A normally occupied lattice site from which an atom or ion is missing. |
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A concentration specification on the basis of weight (or mass) of a particular element relative to the total alloy weight (or mass). |
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