Term
62. (016) Which feature of the Fluke 8025A locks the measurement into the display for viewing and automatically updates the display when you take a new measurement?
a. Rotary switch.
b. Range push button.
c. Power-up self-test.
d. Touch-hold push button. |
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Definition
d. Touch-hold push button |
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Term
63. (017) Which current range on the Fluke 8025A do you select to measure 250 milliamps alternating current (AC)? a. Microamps direct current (DC).
b. Microamps AC.
c. Milliamps/amp DC.
d. Milliamps/amp AC. |
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Definition
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64. (017) When testing a diode with the 8025A, the leads across a “good” diode produces an “OL” (open) on the display in one direction while reversing the leads produces
a. a continuous audible tone.
b. “SL” (short) on the display.
c. a wavering audible tone.
d. three short beeps. |
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Definition
a. a continuous audible tone |
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Term
65. (018) How are voltage, time, and depth represented on the oscilloscope display?
a. Voltage = intensity, time = vertical axis, and depth = horizontal axis.
b. Voltage = intensity, time = horizontal axis, and depth = vertical axis.
c. Voltage = horizontal axis, time = vertical axis, and depth = intensity.
d. Voltage = vertical axis, time = horizontal axis, and depth = intensity. |
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Definition
d. Voltage = vertical axis, time = horizontal axis, and depth = intensity |
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Term
66. (018) Which mode of triggering an oscilloscope causes a trace to be drawn on the screen at all times, whether there is an input signal or not?
a. Auto.
b. Norm.
c. External.
d. Source. |
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Definition
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Term
67. (019) Which probe does not need to actually make contact with the circuit under test?
a. Current probe.
b. Passive 1:1 probe.
c. Active (FET) probe.
d. Passive divider, 10:1 probe. |
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Definition
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68. (020) What digital storage oscilloscope circuit compensates for high sampling rates of high frequency signals?
a. Analog-to-digital converter.
b. Digital-to-analog converter.
c. Charged coupled device.
d. Cathode-ray tube. |
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Definition
c. Charged coupled device |
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Term
69. (020) Sampled data points are stored in the memory of a digital storage oscilloscope as
a. sequential records.
b. waveform points.
c. record lengths.
d. record points. |
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Definition
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70. (020) What area of a digital storage oscilloscope takes digitized samples and performs numerous manipulations on the data including measuring rise and fall times, periods, time intervals, and math computations?
a. Microprocessors.
b. Acquisition.
c. Memory.
d. Input. |
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Definition
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71. (020) What type of sampling does a digital storage oscilloscope normally use on single-shot or seldom-occurring signals?
a. Sequential.
b. Repetitive.
c. Real-time.
d. Random. |
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Definition
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72. (020) In real-time sampling, what type of interpolation is used when measuring pulse waves?
a. Sine.
b. Linear.
c. Non-uniform.
d. Companding. |
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Definition
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Term
73. (020) Which are the three types of digital storage oscilloscope acquisition modes, and which is the standard operating mode?
a. Sample, peak detect, averaging; sample.
b. Real-time, peak detect, sample; real-time.
c. Real-time, peak detect, sample; averaging.
d. Sample, peak detect, averaging; peak detect. |
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Definition
a. Sample, peak detect, averaging; sample |
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Term
74. (020) In acquiring a 4K record length on a digital storage oscilloscope, how many samples can you view at one time?
a. 1,000.
b. 2,000.
c. 3,000.
d. 4,000. |
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Definition
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Term
75. (021) What test equipment provides a bit error detection system that can determine the received data quality after traveling over a communications link?
a. Megger.
b. Multimeter.
c. Oscilloscope.
d. Bit error rate (BER). |
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Definition
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Term
76. (021) What pattern simulator section of the bit error rate test set accepts a 48-bit parallel word and generates a serial pattern?
a. 48-bit transmitter only.
b. Pseudo random noise (PRN) generator.
c. Pseudo random noise (PRN) comparator.
d. 48-bit register and 8-bit word display. |
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Definition
a. 48-bit transmitter only |
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Term
77. (021) What pattern simulator section of the bit error rate test set converts the non-return zero-level (NRZ-L) data into the desired coding, such as non-return zero-mark (NRZ-M)?
a. Data drivers.
b. Code converter.
c. External data comparator.
d. Pseudo random noise (PRN) generator. |
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Definition
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Term
78. (021) What pattern synchronizer and error counter section of the bit error rate test set internally generates its own pattern to compare with the received data from the data/clock receivers?
a. 48-bit transmitter.
b. 48-bit synchronizer/comparator.
c. External data pattern synchronizer/comparator.
d. Pseudo random noise (PRN) synchronizer/comparator. |
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Definition
d. Pseudo random noise (PRN) synchronizer/comparator |
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Term
79. (022) Which of these bit rates do you use for a bit error rate test on a 64 Kbps data circuit?
a. 511 bps.
b. 9,600 bps.
c. 64 Kbps.
d. 1.544 Mbps. |
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Definition
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Term
80. (022) On the bit error rate test (BER) set, the 25-pin connectors are designed to operate with data modems to
a. simplify connection of test equipment to the modem under test and to transmit the test pattern.
b. simplify connection of test equipment to the modem under test and to carry the necessary signaling and handshake signals for modem operations.
c. isolate test equipment from the data circuit under test and to transmit the test pattern.
d. isolate test equipment from the data circuit under test and to carry the necessary signaling and handshake signals for modem operations. |
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Definition
b. simplify connection of test equipment to the modem under test and to carry the necessary signaling and handshake signals for modem |
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Term
81. (023) System grounds must continually be tested
a. randomly.
b. periodically.
c. every 10 years.
d. just one time only. |
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Definition
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Term
82. (024) A known current is generated by the earth ground tester between the earth ground electrode and the a. grounding point.
b. inner earth stake Y.
c. auxiliary current probe.
d. auxiliary potential probe. |
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Definition
c. auxiliary current probe. |
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Term
83. (024) Where is voltage potential measured in the fall of potential ground testing method?
a. Between the auxiliary potential electrode and the earth ground electrode.
b. Between the auxiliary current electrode and the earth ground electrode.
c. Between the auxiliary potential and auxiliary current electrodes.
d. Between the earth ground electrode and the outer stake Z. |
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Definition
a. Between the auxiliary potential electrode and the earth ground electrode. |
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Term
84. (024) The Institute of Electrical and Electronics Engineers (IEEE) have recommended a ground resistance value of
a. 5 ohms or less.
b. 10 ohms or less.
c. 20 ohms or less.
d. 25 ohms or less. |
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Definition
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Term
85. (025) What component on a protocol analyzer process the frames based on the selected test and user configuration inputs?
a. Counter.
b. Buffer.
c. Central processing unit (CPU).
d. Filter. |
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Definition
c. Central processing unit |
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Term
86. (025) What protocol analyzer test window provides information concerning the network utilization and frame error that are related to a specific protocol?
a. Media access control (MAC) node statistics.
b. Connection statistics.
c. Protocol statistics.
d. Node discovery. |
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Definition
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Term
87. (025) What protocol analyzer test window reports errors that occur at the physical layer such as bad frame check sequence (FCS), short frames, and jabbers?
a. Media access control (MAC) node statistics.
b. Connection statistics.
c. Protocol statistics.
d. Node discovery. |
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Definition
a. Media access control (MAC) node statistics |
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Term
88. (025) What active test is selected to see the path that the packets are traveling and the time it takes the packets to compete the trip.
a. Packet Internetwork Groper (PING).
b. Trace Route.
c. Traffic Generator.
d. Route Generator. |
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Definition
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